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Analytical Sciences Symposia

Category: Featured Symposium

A08.P1 - Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences

(131) Getting The Best Spatial Resolution By Using Low kV EDS in FIB Workflows

Tuesday, July 25, 2023

3:00 PM – 5:00 PM US CST

Location: Exhibit Hall

Presenting Author(s)

MH

Michael Hjelmstad

Applications Specialist
Oxford Instruments North America
Pleasanton, California, United States
Simon Burgess, PhD

Business Manager
Oxford Instruments NanoAnalysis
High Wycombe, England, United Kingdom
Haithem Mansour, PhD M.Eng.

EDS Product Manager
Oxford Instruments NanoAnalysis
High Wycombe, England, United Kingdom