Oxford Instruments | Backscattered Electron and X-ray Imaging (BEX)
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
point electronic GmbH | Custom scan patterns with external TEM scan controller (DISS6)
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Protochips Inc. | Machine vision-based in situ TEM for studying energy materials
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
SEC Co., Ltd | Raman, CL, EDS and EBIC on a tabletop SEM
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
TESCAN | Accelerating and Advancing Nanoscale Characterization of Materials by seamless 4D-STEM workflows using the new TESCAN TENSOR analytical STEM microscope
Location: Exhibit Hall
Tuesday, July 25, 2023
5:45 PM – 6:45 PM US CST
Vendor Tutorials
5:45 PM – 6:45 PM US CST
3D-Micromac AG | microPREP PRO: New Vistas for Failure Analysis and Sample Preparation
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Abberior Instruments America | Super-resolution, from the Inventors of STED
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Angstrom Scientific Inc. | Unlocking the Potential of In-Situ Microscopy
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Barnett Technical Services | Precise Microsampling with a Benchtop Micromanipulator
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Bruker | Benchtop XRM
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Bruker AXS LLC | Full Range Energy Dispersive Spectroscopy (EDS): Revealing higher energy transitions, better lower limits of detection and greater depth of information
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
CAMECA | The Latest APT Technology and Applications from the 2023 APT&M CAMECA Presentations
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
DECTRIS | 4D STEM in practice with DECTRIS ARINA
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Direct Electron | Recent Advancements in Direct Detection Cameras
Location: Exhibit Hall
Direct Electron, LP
5:45 PM – 6:45 PM US CST
Electron Microscopy Scientific | Why there are cracks in my coating? How to avoid mistakes in sample preparation for Electron Microscopy Imaging.
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
GATAN/EDAX | EMultimodal in-situ spectroscopy
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
GATAN/EDAX | How to use spherical indexing in OIM Analysis for better data quality
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Hitachi High-Tech America, Inc. | Automated Materials Analysis for Electronics and Battery Recycling
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
JEOL USA | A New FIB/SEM for TEM Sample Preparation Workflow
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Linkam Scientific Instruments | CryoGenium: new options with the automated robot for plunge-freezing of cryo-samples
Nion Company | Nion Swift - A tool for Data Acquisition, Analysis, and Advanced Microscopy
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
point electronic GmbH | Novel electrode-based BSE detector for in-situ microscopy
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
Quantifoil and SPT Labtech | An Introduction to HexAuFoil next-generation cryoEM grids
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
SiriusXT | Biological Soft X-ray Tomography
Location: Exhibit Hall
5:45 PM – 6:45 PM US CST
TESCAN | Streamlining Materials Science Sample Characterization with Highly Automated FIB-SEM TEM Sample Preparation for analysis in TESCAN TENSOR 4D-STEM
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